Quantitative transmission electron microscopy at atomic resolution
نویسندگان
چکیده
منابع مشابه
Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy
Dr. ir. A.J. den Dekker heeft als begeleider in belangrijke mate aan de totstandkoming van het proefschrift bijgedragen.
متن کاملScanning transmission electron microscopy at high resolution.
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...
متن کاملQuantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
A model-based method is proposed to relatively quantify the chemical composition of atomic columns using high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) images. The method is based on a quantification of the total intensity of the scattered electrons for the individual atomic columns using statistical parameter estimation theory. In order to apply this the...
متن کاملHigh-resolution transmission electron microscopy
High-resolution transmission electron microscopy (HRTEM) has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale. This is especially the case for high Tc superconductors (HTSCs). The most characteristic feature in crystal structures of HTSCs is that there is a common structural element, a CuO2 plan...
متن کاملAtomic resolution three-dimensional electron diffraction microscopy.
We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 A from 29 simulated noisy diffraction patterns....
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2012
ISSN: 1742-6596
DOI: 10.1088/1742-6596/371/1/012009